发明名称 INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device which suppresses an error in a measured result and enables measurement at various temperatures.SOLUTION: An inspection device in one embodiment includes: an inspection stage which has a fixing means and a plurality of openings and to which an object to be inspected is fixed by the fixing means; a current terminal which performs inspection in contact with the object to be inspected through the opening; and a voltage terminal which performs inspection in contact with the object to be inspected through the opening.
申请公布号 JP2014013156(A) 申请公布日期 2014.01.23
申请号 JP20120150022 申请日期 2012.07.03
申请人 TOSHIBA CORP 发明人 MITA HIROSHI;MORINO KEIJI
分类号 G01R31/26;G01N27/00 主分类号 G01R31/26
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