发明名称 CHARGED PARTICLE BEAM APPARATUS
摘要 The present invention provides a charged particle beam apparatus which is provided with a tilting deflector which is disposed between a charged particle source and an objective lens and tilts a charged particle beam, wherein a first optical element includes an electromagnetic quadrupole which generates dispersion to suppress the dispersion which is generated by deflection by the tilting deflector, and a second optical element is composed of a deflector for deflecting the charged particle beam which enters the first optical element or an electromagnetic quadrupole which causes the charged particle beam to generate a dispersion different from the dispersion generated by the first optical element.
申请公布号 US2014021366(A1) 申请公布日期 2014.01.23
申请号 US201313789434 申请日期 2013.03.07
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 DOHI HIDETO;IKEGAMI AKIRA;KAZUMI HIDEYUKI
分类号 H01J3/26;H01J3/14 主分类号 H01J3/26
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