发明名称 MEASURING APPARATUS
摘要 <p>A measuring apparatus includes a sensor unit that includes a coil and a conductive cylinder arranged such that an area of an overlap zone varies as a position of an object changes; a capacitor and a resistor that make up a series circuit with the coil; a voltage applier that applies an input voltage Vi to the series circuit; a phase detector that detects a phase of a voltage Vo across the capacitor; a magnitude detector that detects a magnitude of the voltage Vo; feature data in which the phase, the magnitude, a temperature of the sensor unit, and an area of the overlap zone are associated with one another; and a calculator that calculates the temperature and the area based on the feature data using the phase and the magnitude detected by actual measurement of the voltage Vo.</p>
申请公布号 KR20140009964(A) 申请公布日期 2014.01.23
申请号 KR20137003598 申请日期 2013.01.09
申请人 LEVEX CORPORATION 发明人 ONISHI KENICHI;YAMAMOTO KENJI
分类号 G01D5/20;G01B7/00;G01D3/028 主分类号 G01D5/20
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