| 摘要 |
<p>The invention provides a method of detecting a region in an OCT scan of an object that is affected by a reflection artifact. The method comprises the steps of: processing the OCT scan to identify a predetermined feature of the object, detecting (S5-S7; S16) an abnormality (10-2; 48) in the identified feature; and using (S8; S16, S17) the detected abnormality to detect the affected region.</p> |
