发明名称 SAMPLE TREATMENT DEVICE, SAMPLE TREATMENT SYSTEM, AND METHOD FOR TREATING A SAMPLE
摘要 There is provided a VUV light processing apparatus that can apply vacuum ultraviolet light to the entire surface of a wafer in excellent reproducibility and can process the wafer with VUV (vacuum ultraviolet) light in excellent reproducibility. A VUV light processing apparatus includes: a chamber connected with a gas supply apparatus and an evacuation apparatus, the chamber being capable of reducing the pressure inside the chamber; a plasma light source that generates VUV light including a wavelength of 200 nm or less, the plasma light source including a plasma generating unit that generates plasma in the chamber; and a VUV transmission filter provided between a stage on which a sample to be processed is placed and the sample in the chamber, the VUV transmission filter transmitting the VUV light including a wavelength of 200 nm or less and not transmitting electrons, ions, and radicals in plasma, the VUV transmission filter having the outer diameter size larger than that of the sample.
申请公布号 KR101353012(B1) 申请公布日期 2014.01.22
申请号 KR20127012758 申请日期 2010.11.16
申请人 发明人
分类号 H01L21/027;H01L21/3065 主分类号 H01L21/027
代理机构 代理人
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