| 摘要 |
The subject of the present invention is to reduce the overall time required for burn-in test. The burn-in board of the present invention includes: a plurality of programmable logic devices capable of varying the circuit structure based on the configuration data; and a plurality of sockets, which can be installed with devices under test and are connected to any one of the plurality of programmable logic devices, each of the plurality of programmable logic devices being connected to the plurality of sockets. Furthermore, each of the plurality of programmable logic devices is at least formed with circuit and memory according to the configuration data given before burn-in test. The circuit generates a test pattern for being supplied to the devices under test that have been installed in the sockets when proceeding with the burn-in test. From the plurality of devices under test connected to the programmable logic devices, the memory reads in parallel the output signals of the devices under test that have been installed in the sockets when proceeding with the burn-in test, and compares the same with a logic value. Then, the comparison result is used as a test result for being stored. |
