发明名称
摘要 In a method of manufacturing a mask blank adapted to be formed with a resist pattern by electron beam writing and having a light-shielding film and an etching mask film of an inorganic-based material resistant to etching of the light-shielding film which are formed in this order on a transparent substrate, when forming the etching mask film, shielding is performed using a shielding plate so as to prevent the etching mask film from being formed at least at a side surface of the substrate.
申请公布号 JP5393972(B2) 申请公布日期 2014.01.22
申请号 JP20070287272 申请日期 2007.11.05
申请人 发明人
分类号 G03F1/40;G03F1/50;G03F1/54 主分类号 G03F1/40
代理机构 代理人
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