发明名称 |
Test circuit arrangement for determining the number of turns and the DC resistance of a coil |
摘要 |
To determine the number of turns and the DC resistance of a coil, it is provided that, at least once for a predetermined period of time during a test process, a magnetic flux changing during this period of time passes through the coil to be tested (PS). This coil is connected to a switch arrangement (S2) which only connects this coil (PS) to a first evaluating device (WME) during the predetermined period of time. This evaluating device determines the number of turns of the coil to be tested by means of the induction voltage occurring across the coil to be tested due to a change in the magnetic flux, and by means of a reference voltage. The switch arrangement (S2) is connected to a second evaluating device (WST) which is connected to the coil to be tested, for determining its DC resistance, whenever the magnetic flux passing through the coil is constant. <IMAGE>
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申请公布号 |
DE3428223(A1) |
申请公布日期 |
1986.02.13 |
申请号 |
DE19843428223 |
申请日期 |
1984.07.31 |
申请人 |
SIEMENS AG |
发明人 |
ROECKERT,WALTER,DIPL.-ING.;BOLENDER,GEORG;EIBICH,CLAUS |
分类号 |
G01R27/02;G01R29/20;(IPC1-7):G01R15/12 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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