发明名称 Method of producing a semiconductor device and semiconductor device having a through-wafer interconnect
摘要 A substrate (1) of semiconductor material is provided with a contact pad (7). An opening (9) is formed through the semiconductor material from an upper surface to the contact pad, the opening forming an edge (18) at or near the upper surface. A dielectric layer (10) is applied on the semiconductor material in the opening. A metallization (11) is applied, which contacts the contact pad and is separated from the substrate by the dielectric layer. A top-metal (12) is applied, which contacts the metallization at or near the edge. A protection layer (13) is applied, which covers the top-metal and/or the metallization at least at or near the edge, and a passivation (15) is applied.
申请公布号 US8633107(B2) 申请公布日期 2014.01.21
申请号 US201013499899 申请日期 2010.09.28
申请人 KRAFT JOCHEN;TEVA JORDI;AMS AG 发明人 KRAFT JOCHEN;TEVA JORDI
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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