发明名称 Phase-locked loop (PLL) fail-over circuit technique and method to mitigate effects of single-event transients
摘要 A PLL fail-over circuit technique and method to mitigate the effects of single-event transients comprises providing a pair of substantially identical phase-locked loops and producing a respective delayed clock signal from each. The outputs of the phase-locked loops are monitored for errors comprising high frequency transients or differences in clock signal outputs from a reference frequency. A clock out signal is output representative of the first delayed clock signal if an error is detected in the second phase-locked loop and the second delayed clock signal is output if an error is detected in the first phase-locked loop.
申请公布号 US8633749(B2) 申请公布日期 2014.01.21
申请号 US201213560774 申请日期 2012.07.27
申请人 BASS DEREK E.;PFEIL JOHN W.;AEROFLEX COLORADO SPRINGS INC. 发明人 BASS DEREK E.;PFEIL JOHN W.
分类号 H03L7/06 主分类号 H03L7/06
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