发明名称 Methods and apparatus for controlling substrate temperature in a process chamber
摘要 Methods and apparatus for controlling the temperature of a substrate during processing are provided herein. In some embodiments, an apparatus for retaining and controlling substrate temperature may include a puck of dielectric material; an electrode disposed in the puck proximate a surface of the puck upon which a substrate is to be retained; and a plurality of heater elements disposed in the puck and arranged in concentric rings to provide independent temperature control zones.
申请公布号 US8633423(B2) 申请公布日期 2014.01.21
申请号 US201113097822 申请日期 2011.04.29
申请人 LIN XING;BUCHBERGER, JR. DOUGLAS A.;ZHOU XIAOPING;TODOROW VALENTIN;NGUYEN ANDREW;SHEYNER ANCHEL;APPLIED MATERIALS, INC. 发明人 LIN XING;BUCHBERGER, JR. DOUGLAS A.;ZHOU XIAOPING;TODOROW VALENTIN;NGUYEN ANDREW;SHEYNER ANCHEL
分类号 H05B1/00;H01L21/683 主分类号 H05B1/00
代理机构 代理人
主权项
地址