发明名称 MASK ALIGNMENT SYSTEM USING CHUCK PLATE
摘要 The present invention relating to an apparatus for aligning a substrate and a mask in a process of manufacturing a semiconductor or a display device and an operating method thereof, improves a problem when aligning an existing mask with a UVW motion is, as it is, applied to a large area substrate using a chuck plate. The present invention correctly holds a horizontal and vertical position of the chuck plate with the UVW motion while making the chuck plate ascend or descend with a hook made of a robot arm in a state of attaching the large area substrate to the chuck plate, thereby can simply and precisely align the check plate and the mask. [Reference numerals] (AA) Chuck plate descending line (UVW adjustment)
申请公布号 KR20140008171(A) 申请公布日期 2014.01.21
申请号 KR20120075541 申请日期 2012.07.11
申请人 YAS CO., LTD. 发明人 JEON, OK CHUL;JEONG, HA KYOUNG;YOO, MYUNG JAE;KIM, HYUNG MIN;CHOI, MYUNG WOON;JEONG, KWANG HO;JUNG, UI SEOK
分类号 H01L21/68;G02F1/13;H01L21/683 主分类号 H01L21/68
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