发明名称 |
MASK ALIGNMENT SYSTEM USING CHUCK PLATE |
摘要 |
The present invention relating to an apparatus for aligning a substrate and a mask in a process of manufacturing a semiconductor or a display device and an operating method thereof, improves a problem when aligning an existing mask with a UVW motion is, as it is, applied to a large area substrate using a chuck plate. The present invention correctly holds a horizontal and vertical position of the chuck plate with the UVW motion while making the chuck plate ascend or descend with a hook made of a robot arm in a state of attaching the large area substrate to the chuck plate, thereby can simply and precisely align the check plate and the mask. [Reference numerals] (AA) Chuck plate descending line (UVW adjustment) |
申请公布号 |
KR20140008171(A) |
申请公布日期 |
2014.01.21 |
申请号 |
KR20120075541 |
申请日期 |
2012.07.11 |
申请人 |
YAS CO., LTD. |
发明人 |
JEON, OK CHUL;JEONG, HA KYOUNG;YOO, MYUNG JAE;KIM, HYUNG MIN;CHOI, MYUNG WOON;JEONG, KWANG HO;JUNG, UI SEOK |
分类号 |
H01L21/68;G02F1/13;H01L21/683 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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