发明名称 |
System for testing motherboard performance |
摘要 |
A system for testing a motherboard performance includes a control device, a voltage processing circuit, a voltage regulating circuit and a voltage feedback circuit. The control device stores a plurality of predetermined voltage values and outputs control signals according to the plurality of predetermined voltage values. The voltage processing circuit receives the control signal and outputs a plurality of PWM signals according to the control signal. The voltage regulating circuit receives the plurality of PWM signal and outputs a plurality of DC voltage to a plurality of voltage input terminals of the motherboard. The voltage feedback circuit collects voltage signals at the plurality of voltage input terminals of the motherboard. |
申请公布号 |
US8633709(B2) |
申请公布日期 |
2014.01.21 |
申请号 |
US201113176328 |
申请日期 |
2011.07.05 |
申请人 |
XIE LING-YU;XIE XING-PING;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
XIE LING-YU;XIE XING-PING |
分类号 |
G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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