发明名称 System for testing motherboard performance
摘要 A system for testing a motherboard performance includes a control device, a voltage processing circuit, a voltage regulating circuit and a voltage feedback circuit. The control device stores a plurality of predetermined voltage values and outputs control signals according to the plurality of predetermined voltage values. The voltage processing circuit receives the control signal and outputs a plurality of PWM signals according to the control signal. The voltage regulating circuit receives the plurality of PWM signal and outputs a plurality of DC voltage to a plurality of voltage input terminals of the motherboard. The voltage feedback circuit collects voltage signals at the plurality of voltage input terminals of the motherboard.
申请公布号 US8633709(B2) 申请公布日期 2014.01.21
申请号 US201113176328 申请日期 2011.07.05
申请人 XIE LING-YU;XIE XING-PING;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 XIE LING-YU;XIE XING-PING
分类号 G01R27/28 主分类号 G01R27/28
代理机构 代理人
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