发明名称 Semiconductor device and test method
摘要 A semiconductor device includes a semiconductor substrate including an element region, an inner sealing and an outer sealing which are formed on the element region and have a first opening part and a second opening part, respectively, a multilayer interconnection structure which is formed on the substrate and stacks multiple inter-layer insulation films each including a wiring layer, a moisture resistant film formed between a first inter-layer insulation film and a second inter-layer insulation film which are included in the multilayer interconnection structure, a first portion which extended from a first side of the moisture resistant film and passes the first opening part, a second portion which extended from a second side of the moisture resistant film and passes through the second opening part, and a wiring pattern including a via plug which penetrates the moisture resistant film and connects the first portion and the second portion.
申请公布号 US8633571(B2) 申请公布日期 2014.01.21
申请号 US201213482146 申请日期 2012.05.29
申请人 OKUTSU AKIHIKO;SAITO HITOSHI;OKANO YOSHIAKI;FUJITSU SEMICONDUCTOR LIMITED 发明人 OKUTSU AKIHIKO;SAITO HITOSHI;OKANO YOSHIAKI
分类号 H01L23/544;H01L29/66 主分类号 H01L23/544
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