发明名称 ADHESIVE TAPE FOR WAFER PROCESSING
摘要 PROBLEM TO BE SOLVED: To provide an adhesive tape for processing that can reduce warpage of a semiconductor wafer, dimple of the back surface of the semiconductor wafer, adhesive deposit onto a surface electrode and pollution of the surface and enable grinding of wafer thin film.SOLUTION: In an adhesive tape for semiconductor wafer processing, one or more low elastic modulus layers 2 are provided on one surface of a base material film 1, an adhesive layer 3 is provided on the low elastic modulus layer(s), the Young's modulus of the base material film 1 is equal to eighth power Pa of 5.0x10 to tenth power Pa of 1.1×10, the elastic modulus G'(25°C) of the low elastic modulus layer(s) 2 is equal to fifth power Pa of 2.5×10 to fifth power Pa of 4.0×10, the elastic modulus G'(60°C) is equal to fifth power Pa of 0.2×10 to fifth power Pa of 1.5×10, the rate of the elastic modulus G'(25°C) to the elastic modulus G'(60°C) is equal to 0.5 or less, the loss tangent tanδ(25°C) is equal to 0.08 to 0.15, the rate of the loss tangent tanδ(25°C) to the loss tangent tanδ(60°C) is equal to 4.0 or more, the thickness of the adhesive layer 3 is equal to 5 to 100 μm, and the thickness of the radiation hardenable type adhesive layer/the thickness of the low elastic modulus layer is equal to 1/2 or less.
申请公布号 JP2014011273(A) 申请公布日期 2014.01.20
申请号 JP20120146005 申请日期 2012.06.28
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人
分类号 H01L21/304;C09J7/02;C09J201/00 主分类号 H01L21/304
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