发明名称 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for reducing the surface roughness of polycrystalline silicon and a processing apparatus therefor.SOLUTION: A plasma processing method includes: (a) a step for growing a polycrystalline silicon layer on a target substrate; and (b) a step for supplying processing gas containing hydrogen-containing gas into a processing container housing the target substrate on which the polycrystalline silicon layer has grown and then emitting microwaves inside the processing container so as to generate hydrogen radicals, thereby exposing the polycrystalline silicon layer to the hydrogen radicals.
申请公布号 JP2014011178(A) 申请公布日期 2014.01.20
申请号 JP20120144368 申请日期 2012.06.27
申请人 TOKYO ELECTRON LTD 发明人 KATAYAMA DAISUKE;HONDA MINORU;NAKANISHI TOSHIO
分类号 H01L21/205;C23C16/24 主分类号 H01L21/205
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