METHOD FOR TRANSFERING PLEATED MICROSTRUCTURE AND METHOD FOR MEASURING ELECTRICAL CHARACTERISTICS OF THE SAME

摘要

A method for transferring a pleated microstructure according to the present invention comprises: (a) a step of forming a one-dimensional microstructure on an expanded elastic substrate; (b) a step of forming creases on the microstructure by contracting the elastic substrate; (c) a step of preparing a curable resin layer and combining the elastic substrate to the curable resin layer so that the pleated microstructure is closely attached to the surface of the curable resin layer; (d) a step of fixing the pleated microstructure on the surface of the curable resin layer by hardening the curable resin layer; and (e) a step of separating the elastic substrate from the hardened curable resin layer. The present invention forms the pleated microstructure and stably and intactly transfers the pleated microstructure to a substrate, thereby being easily and exactly able to measure the structural, spectroscopic and electrical properties of the pleated microstructure.