| 摘要 |
<p>The method involves emitting localization waves (OL1, OL2) from a reference object (1) and reflecting the waves using a reflection unit (5) situated on an object to be located (2). The waves are received and transformed into a single collected reflected signal (SRC) in an electric form. The signal is processed to extract the waves following a direct path and parasite localization waves following parasite reflectionless paths. Short propagation times of the localization waves, of respective localization signals (SL1, SL2), corresponding to the reflectionless paths, are determined. The reflection unit is an active reflection unit or a passive reflection unit e.g. reflex reflector, for light localization waves and cube-corner type reflector for electromagnetic localization waves. An independent claim is also included for a device for locating an object with respect to a reference trihedron related to a reference object.</p> |
