| 摘要 |
<p>The method involves applying a predetermined input signal (SINref) as input of an electronic component (4). An emitted electromagnetic emission is measured by the component during processing of the input signal so as to provide a predetermined measuring signal (MES) to the component. A measurement electromagnetic signature of the electromagnetic emissions emitted by the component is determined from the measurement signal during processing of the predetermined input signal. The electromagnetic signature is compared with a predetermined reference electromagnetic signature (EMref). The electronic component is designed as a microprocessor, a RAM, a ROM, a specialized integrated circuit (IC) or an application specific integrated circuit (ASIC) and/or a programmable logical circuit (PLC) or field-programmable gate array (FPGA) circuit. An independent claim is also included for an electronic device comprising an electronic component.</p> |
