| 摘要 |
PROBLEM TO BE SOLVED: To sufficiently obtain the number of grain boundaries to suppress occurrence of short circuit and structural defects, etc., and simultaneously obtain a high dielectric constant even when dielectric ceramics having a core shell structure are thinned at a thickness of, for example, 0.5 μm or less.SOLUTION: Dielectric ceramics using an ABObased compound (A includes Ba and B includes Ti) as a principal component and having one layer thickness of 0.5 μm or less level has a grain size distribution in which a volume ratio of dielectric sintered grains having a grain size of 0.02-0.15 μm to the whole sintered grains is 1-10%. The average grain size of the whole sintered grains is preferably 0.13-0.25 μm. Thereby, a high dielectric constant and high reliability in the dielectric ceramics are achieved. |
