发明名称 FinFET with Trench Field Plate
摘要 An integrated circuit device includes a pad layer having a body portion with a first doping type laterally adjacent to a drift region portion with a second doping type, a trench formed in the pad layer, the trench extending through an interface of the body portion and the drift region portion, a gate formed in the trench and over a top surface of the pad layer along the interface of the body portion and the drift region portion, an oxide formed in the trench on opposing sides of the gate, and a field plate embedded in the oxide on each of the opposing sides of the gate.
申请公布号 US2014015048(A1) 申请公布日期 2014.01.16
申请号 US201213546738 申请日期 2012.07.11
申请人 NG CHUN-WAI;CHOU HSUEH-LIANG;SU PO-CHIH;LIU RUEY-HSIN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 NG CHUN-WAI;CHOU HSUEH-LIANG;SU PO-CHIH;LIU RUEY-HSIN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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