发明名称 PARTICLE CHARACTERISTIC MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a particle characteristic measurement apparatus capable of simultaneously calculating the particle size and the zeta potential of an electrophoretic fine particle.SOLUTION: The particle characteristic measurement apparatus comprises: a laser oscillator having a light source and irradiating an object to be measured that contains a solvent and fine particles dispersed in the solvent with a laser beam output from the light source; a light detection unit for converting a laser output beam which is modulated with a scattered feedback beam from the object to be measured, into a signal; and a signal processor for analyzing the signal converted by the light detection unit. The signal processor obtains frequency characteristics of an intensity fluctuation of the modulated laser output beam by analyzing the signal, determines a diffusion coefficient of a fine particle contained in the object to be measured from the frequency characteristics of the intensity fluctuation, and determines a particle size of the fine particle contained in the object to be measured from the diffusion coefficient. The signal processor also determines a moving velocity of the fine particle contained in the object to be measured from the frequency characteristics of the intensity fluctuation and determines the zeta potential of the fine particle contained in the object to be measured from the moving velocity.
申请公布号 JP2014006173(A) 申请公布日期 2014.01.16
申请号 JP20120142705 申请日期 2012.06.26
申请人 GOTO IKUEIKAI 发明人 SUDO SEIICHI;OTSUKA KENJU
分类号 G01N15/02;G01N27/26 主分类号 G01N15/02
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