发明名称 ATOMIC LAYER ETCHING WITH PULSED PLASMAS
摘要 PROBLEM TO BE SOLVED: To provide a plasma etching method for manufacturing nanodevices with cost efficiency.SOLUTION: A system and method for rapid atomic layer etching (ALET) includes a pulsed plasma source and a reaction chamber. The plasma source includes a spiral coil electrode, a cooled Faraday shield, a counter electrode disposed at the top of the tube, and a gas inlet. The reaction chamber includes a substrate support and a boundary electrode. The method includes positioning an etchable substrate in a plasma etching chamber, forming a product layer on the surface of the substrate, removing a portion of the product layer by pulsing a plasma source, and then repeating the steps of forming a product layer and removing a portion of the product layer to form an etched substrate.
申请公布号 JP2014007432(A) 申请公布日期 2014.01.16
申请号 JP20130217145 申请日期 2013.10.18
申请人 UNIV OF HOUSTON SYSTEM 发明人 DONNELLY VINCENT M;DEMETRE J ECONOMOU
分类号 H01L21/3065 主分类号 H01L21/3065
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