Development of a Contrast Phantom for Active Millimeter Wave Imaging Systems

摘要

A contrast phantom for an active millimeter wave imaging system is made from different materials or sections having different reflectivities. The reflectivities incrementally increase in discrete steps so that the phantom is useable to calibrate the active millimeter wave imaging system. The reflectivities preferably range from 0% to 100% and incrementally and linearly increase in equal steps. A method of producing the contrast phantom for the active millimeter wave imaging system is also described.