| 摘要 |
<p>The present invention relates to a method of measuring a mass spectrum of ions generated at a constant temperature. More particularly, the present invention relates to a method of measuring a mass spectrum of ions generated at a constant temperature, the method including selecting only spectrums having the same decomposition pattern of ions of a sample, a matrix, or a third material from among a plurality of mass spectrums obtained from ions formed by applying energy to a specimen formed by mixing the matrix and the sample or a specimen formed by mixing the matrix, the sample, and the third material.</p> |
