| 摘要 |
A noncontact light emitting diode inspecting apparatus according to one embodiment of the present invention is an inspecting apparatus for judging pass or fail of a light emitting diode by photographing the light emitting diode with a camera and then comparing the photographed image with a previously inputted target image, and includes: a stage part which is loaded with the light emitting diode and fixes or transports the light emitting diode to an inspection position; a camera which is located on the upper part of the stage part and photographs images of the light emitting diode; a lighting part including a first lighting part, which is located between the stage part and the camera and has, on the upper side thereof, a light source for emitting a visible light of a green wavelength band and a semi-reflector for reflecting the visible light emitted from the light source and then making the reflected light be incident on the light emitting diode in parallel with an optical axis of the camera, a second lighting part which is located around an aperture prepared for security of sight of a lens of the camera under the first lighting part and emits a white light and a visible light of a blue wavelength band to the light emitting diode, and a third lighting part which is located under the second lighting part, emits a visible light of a blue wavelength band to the light emitting diode, and can control the emitting angle; a control part which synthesizes a plurality of images photographed by the camera into one image; and a vision processing part which judges pass or fail of the light emitting diode by reading out the image synthesized in the control part. The stage part and the camera include a motion controller. |
