发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND PROCESS OF MANUFACTURING THE SAME
摘要 In device isolation trenches, a first device-isolation insulator film is formed to have recesses thereon and a second device-isolation insulator film is formed in the recesses. The uppermost portions at both ends of the first device-isolation insulator film are located higher than the uppermost portions at both ends of the second device-isolation insulator film.
申请公布号 US2014017875(A1) 申请公布日期 2014.01.16
申请号 US201314025548 申请日期 2013.09.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YAEGASHI TOSHITAKE;UENO KOKI
分类号 H01L21/76;H01L21/8234;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/76
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