发明名称 ANTIREFLECTIVE COATING FOR SEMICONDUCTOR DEVICES AND METHOD FOR THE SAME
摘要 <p>According to one embodiment of the present invention, a semiconductor device includes a first layer of dielectric material disposed upon an upper surface of a substrate of a semiconductor device and a first non-conductive layer of metal disposed upon an upper surface of the dielectric material. The first layer of dielectric material and the first non-conductive layer of metal act as an optical trap for electromagnetic radiation received by the first non-conductive layer of metal. In particular embodiments, the semiconductor device may further comprise a second layer of dielectric material disposed upon an upper surface of the first non-conductive layer of metal and a second non-conductive layer of metal disposed upon an upper surface of the second layer of dielectric material.</p>
申请公布号 EP1869520(B1) 申请公布日期 2014.01.15
申请号 EP20060738476 申请日期 2006.03.15
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SUDAK, PAUL, G.;ADAMS, ROBERT, L.;NEIDRICH, JASON, M.;JACOBS, SIMON, JOSHUA;WESNESKI, LISA, ANN;WILLS, LINDA, M.;CARTER, WILLIAM, D.;FREDERIC, JUDITH, C.
分类号 B81B3/00;G02B5/00;G02B5/22;G02B26/00;G02B26/08;G02B27/00;G02F1/00;G02F1/03;G02F1/07;G02F1/29 主分类号 B81B3/00
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