发明名称 Wake-up signal test system having a test card for testing wake-up signal output by a platform controller hub of a motherboard
摘要 A wake-up signal test system to test a wake-up signal output by a platform controller hub (PCH) of a motherboard includes a test card and an oscillograph. The test card includes a board with an edge connector, and a button. The button is connected between a first ground pin and a first wake-up signal pin of the edge connector. When the edge connector is inserted into a peripheral component interconnect express (PCIe) socket of the motherboard, the first ground pin is connected to a second ground pin of the PCIe socket, the first wake-up signal pin is connected to a second wake-up pin of the PCIe socket. When the button is pressed, the first wake-up signal pin is connected to the first ground pin to output a low level signal to the PCH to wake up the motherboard. The oscillograph displays a voltage state of the low level signal.
申请公布号 US8631182(B2) 申请公布日期 2014.01.14
申请号 US201113169475 申请日期 2011.06.27
申请人 LI HUI;LI YU-MEI;ZHANG HAO;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 LI HUI;LI YU-MEI;ZHANG HAO
分类号 H05K7/10;G06F13/40 主分类号 H05K7/10
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