| 摘要 |
A process of detecting a defective recording element and a process of correcting the defective recording element are performed with appropriate processing loads. When the detection process and the correction processes are performed with small loads, for example, at a time of recording, a resolution used for reading an inspection pattern is set lower than that set in a case where the processes can be performed with small loads, for example, at down time before recording. The reading resolution to be set may be determined by an apparatus in accordance with a processing load or may be arbitrarily determined by a user. |
