发明名称 |
Drain extended MOS device for bulk FinFET technology |
摘要 |
Some aspects relate to a FinFET that includes a semiconductor fin disposed over a semiconductor substrate and extending laterally between a source region and a drain region. A shallow trench isolation (STI) region laterally surrounds a lower portion of the semiconductor fin, and an upper portion of the semiconductor fin remains above the STI region. A gate electrode traverses over the semiconductor fin to define a channel region in the semiconductor fin under the conductive gate electrode. A punch-through blocking region can extend between the source region and the channel region in the lower portion of the semiconductor fin. A drain extension region can extend between the drain region and the channel region in the lower portion of the semiconductor fin. Other devices and methods are also disclosed. |
申请公布号 |
US8629420(B1) |
申请公布日期 |
2014.01.14 |
申请号 |
US201213540762 |
申请日期 |
2012.07.03 |
申请人 |
SHRIVASTAVA MAYANK;GOSSNER HARALD;INTEL MOBILE COMMUNICATIONS GMBH |
发明人 |
SHRIVASTAVA MAYANK;GOSSNER HARALD |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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