发明名称 Central processing unit test system
摘要 A central processing unit (CPU) test system includes a CPU socket, a CPU core controller, and a CPU test device. The CPU core controller stores a start voltage message. The CPU test device includes a voltage detection pin, an analog to digital (A/D) converter, and a microcontroller. The voltage detection pin detects a voltage of an electronic device connected to the CPU socket. The A/D converter converts the detected voltage into a digital signal. The microcontroller controls the CPU core controller to output the start voltage to the CPU socket according to the digital signal. The microcontroller stores a predetermined start voltage message. The microcontroller reads the start voltage message after controlling the CPU core controller to output the start voltage, and determines whether the CPU core controller supplies the start voltage to the CPU socket by comparing the read start voltage message with the predetermined start voltage message.
申请公布号 US8629680(B2) 申请公布日期 2014.01.14
申请号 US201113239417 申请日期 2011.09.22
申请人 FU YING-BIN;GE TING;PAN YA-JUN;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 FU YING-BIN;GE TING;PAN YA-JUN
分类号 G01R31/00;G06F11/26 主分类号 G01R31/00
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