发明名称 Non-volatile memory cell structure and a method of fabricating the same
摘要 A non-volatile memory cell structure and a method of fabricating the same. The method comprising the steps of: fabricating a portion of a floating gate from one or more first metal local interconnection layer (LIL) slit contacts deposited on a patterned dielectric layer; and fabricating a portion of a control gate from one or more second metal LIL slit contacts deposited on the patterned dielectric layer; wherein the first and second metal LIL slit contacts form a capacitive structure between the floating gate and the control gate.
申请公布号 US8629032(B2) 申请公布日期 2014.01.14
申请号 US201113008407 申请日期 2011.01.18
申请人 HUANG SHENG HE;SYSTEMS ON SILICON MANUFACTURING CO. PTE. LTD. 发明人 HUANG SHENG HE
分类号 H01L21/331 主分类号 H01L21/331
代理机构 代理人
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