发明名称 Defective word line detection
摘要 Methods and non-volatile storage systems are provided for detecting defects in word lines. A "broken" word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this may indicate a broken word line.
申请公布号 US8630118(B2) 申请公布日期 2014.01.14
申请号 US201113292556 申请日期 2011.11.09
申请人 SAKAI MANABU;MIWA TORU;SANDISK TECHNOLOGIES INC. 发明人 SAKAI MANABU;MIWA TORU
分类号 G11C16/04 主分类号 G11C16/04
代理机构 代理人
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