发明名称 In-situ contact potential measurement in hard-disk drives
摘要 Approaches are provided for a hard-disk drive (HDD) and a method for measuring the contact potential between head and disk interfaces within a hard-disk drive. In one example, a voltage bias is applied to a head slider at discrete increments, and the touchdown power is determined at each increment. The voltage bias at which the TDP maximizes equals the inverse polarity of the inherent contact potential between the head slider and disk, and this value may be used to apply a voltage that neutralizes the contact potential.
申请公布号 US8630057(B2) 申请公布日期 2014.01.14
申请号 US201213495513 申请日期 2012.06.13
申请人 MURTHY ARAVIND N.;PIT REMMELT;FLECHSIG KARL ARTHUR;HGST NETHERLANDS B.V. 发明人 MURTHY ARAVIND N.;PIT REMMELT;FLECHSIG KARL ARTHUR
分类号 G11B21/02;G11B27/36 主分类号 G11B21/02
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