发明名称 Charged particle radiation device
摘要 Disclosed is a high resolution and high throughput charged particle radiation device that attenuates the natural vibration of an ion pump in a short time, excited by a reaction force at the time of driving the stage, and prevents occurrence of a loop of force and a loop of current. The charged particle radiation device includes a sample chamber (4) for disposing a sample (3) therein, a charged particle radiation optical lens tube (1) for irradiating the sample (3) with charged particle radiation (10), ion pumps (2a, 2b) for evacuating the charged particle radiation optical lens tube (1), a frame (16) fixedly attached to the sample chamber (4), the frame (16) facing one end of each of the ion pumps (2a, 2b), and vibration absorbers provided between the frame (16) and the one end of each of the ion pumps (2a, 2b), each of the vibration absorbers including a layered structure which includes a viscoelastic sheet (20a, 20b) sandwiched between metal plates (18a, 18b, 21a, 21b).
申请公布号 US8629410(B2) 申请公布日期 2014.01.14
申请号 US201013378827 申请日期 2010.06.03
申请人 TSUJI HIROSHI;ISHIGURO KOUJI;TACHIBANA ICHIRO;SUZUKI NAOMASA;ONUKI KATSUNORI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 TSUJI HIROSHI;ISHIGURO KOUJI;TACHIBANA ICHIRO;SUZUKI NAOMASA;ONUKI KATSUNORI
分类号 H01J37/20 主分类号 H01J37/20
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