发明名称 DISPOSITIF BLINDE DE MICROSCOPE ELECTRONIQUE A BALAYAGE
摘要 <p>The invention relates to an electronic scanning microscope (16) for hazardous, e.g. irradiated, samples, which microscope is not provided in a negative-pressure housing but is coupled to the same (6) using a bellow junction, which has the advantage of providing a disconnection concerning the vibrations generated when maintaining the negative pressure, whereby the vibration are not transmitted to the microscope (16) and do not alter the measurements nor the image quality. The microscope electronics is not subjected to the polluted atmosphere. The housing and the device in turn have a smaller volume. The assembly can be improved by placing the microscope (16) and the housing (6) onto separate bearings. A gate divided into two portions respectively associated with the microscope and the housing can be placed at the junction and makes it possible to separate the microscope from the housing in order to facilitate the maintenance thereof.</p>
申请公布号 FR2982413(B1) 申请公布日期 2014.01.10
申请号 FR20110060216 申请日期 2011.11.09
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES 发明人 LEORIER CAROLINE;CARON SERGE;COURROYE DANIEL;BRENNEIS CHRISTOPHE;WIDEHEM MICHEL;PLATON RAPHAEL;RIGOTARD-BARBADORO JEAN-PAUL;DUBUC FABRICE;CHALAL SMAIL
分类号 H01J37/28;H01J37/16;H01J37/18 主分类号 H01J37/28
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