| 摘要 |
A generic data scrambler for a memory circuit test engine. An embodiment of a memory device includes a memory; a memory controller for the memory; a built-in self-test (BIST) circuit for the testing of the memory; and a generic data scrambler for scrambling of data according to a scrambling algorithm for the memory, where each algorithm is based on values of an address for data. The generic data scrambler includes a programmable lookup table to hold values for each possible outcome of the algorithm, the lookup table to generate a set of data factors, and a logic for combining the data with the data factors to generate scrambled data. |
