发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device which can achieve short-time aging for restoring a vacuum degree of an X-ray tube.SOLUTION: An X-ray inspection device includes: a non-use time calculation section 63 for calculating an X-ray stop time from when an X-ray tube 12 stops X-ray emission; a vacuum degree detector 69 detecting a vacuum degree inside the X-ray tube 12; an aging condition determination section 54 for determining an aging condition of an aging operation for restoring the vacuum degree of the X-ray tube 12 according to the X-ray stop time calculated by the non-use time calculation section 63 and the vacuum degree detected by the vacuum degree detector 69; and a high-voltage power supply controller 66 performing the aging operation on the aging condition determined by the aging condition determination section 54.
申请公布号 JP2014002023(A) 申请公布日期 2014.01.09
申请号 JP20120137099 申请日期 2012.06.18
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 MITANI SATOSHI;KIBA HIROYUKI
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
主权项
地址