发明名称 |
CORRECTION METHOD OF ALIGNMENT LAYER, CORRECTION APPARATUS OF ALIGNMENT LAYER AND MANUFACTURING METHOD OF LIQUID CRYSTAL PANEL |
摘要 |
PROBLEM TO BE SOLVED: To provide a correction method of an alignment layer capable of accurately detecting a defect in the alignment layer and correcting it.SOLUTION: A correction method of a defect of an alignment layer includes: a step (a) of acquiring an image of a pixel pattern (a repeated pattern) in the surface of the alignment layer formed on the surface of a substrate; a step (b) of acquiring adjacent images (four images positioned vertically and horizontally) around the image of the pixel pattern; a step (c) of synthesizing the image of the pixel pattern and an image connecting the adjacent images; and a step (d) of specifying the defect of the alignment layer by comparing the image of the pixel pattern in the connected images with the adjacent images. |
申请公布号 |
JP2014002178(A) |
申请公布日期 |
2014.01.09 |
申请号 |
JP20120135473 |
申请日期 |
2012.06.15 |
申请人 |
SHARP CORP |
发明人 |
YOSHINO YASUSHI |
分类号 |
G02F1/13;G01M11/00;G01N21/956;G02F1/1337 |
主分类号 |
G02F1/13 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|