发明名称 CORRECTION METHOD OF ALIGNMENT LAYER, CORRECTION APPARATUS OF ALIGNMENT LAYER AND MANUFACTURING METHOD OF LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To provide a correction method of an alignment layer capable of accurately detecting a defect in the alignment layer and correcting it.SOLUTION: A correction method of a defect of an alignment layer includes: a step (a) of acquiring an image of a pixel pattern (a repeated pattern) in the surface of the alignment layer formed on the surface of a substrate; a step (b) of acquiring adjacent images (four images positioned vertically and horizontally) around the image of the pixel pattern; a step (c) of synthesizing the image of the pixel pattern and an image connecting the adjacent images; and a step (d) of specifying the defect of the alignment layer by comparing the image of the pixel pattern in the connected images with the adjacent images.
申请公布号 JP2014002178(A) 申请公布日期 2014.01.09
申请号 JP20120135473 申请日期 2012.06.15
申请人 SHARP CORP 发明人 YOSHINO YASUSHI
分类号 G02F1/13;G01M11/00;G01N21/956;G02F1/1337 主分类号 G02F1/13
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