MULTIPLE ELEMENT X-RAY DETECTOR

摘要

PROBLEM TO BE SOLVED: To scattering in sensitivity between mutual arrays of detection elements or between detection elements caused by scattering in the close contact condition between the detection element and optical reflection means for preventing generation of leakage from the upper surface of detection element by using an optical reflection layer as optical reflection means layer directly on the upper surface of each scintillator layer. SOLUTION: A light reflection layer as light reflection means for preventing leakage of light from the upper surface of scintillator layer 703 of each detection element 710 is formed directly on the upper surface of each scintillator surface 703. The reflection layer is formed thereon by coating the layer 703 with the material composed of epoxy resin and pigment added thereto. A white color is effective so that the light reflection material obtained by mixing a white coloring agent such as titanium dioxide or barium oxide in epoxy resin is evenly applied and after the solidification it is layer for every channels of the detection elements 710. An X-ray which was incident to the layer 703 is incident to all semiconductor layers 701 without being incident to its incident surface side.