| 摘要 |
PROBLEM TO BE SOLVED: To enhance the efficiency of repairing a word line in a semiconductor device of a type in which a plurality of word lines are selected at one time by one row address.SOLUTION: A semiconductor device 10 includes a bank 20-1, a defective word line address register 36, and an array control circuit 37. The bank 20-1 includes: a plurality of word lines WL which include a first word line WL1 being a defective word line and a second word line WL1 being a normal word line that is not defective; and at least one redundant word line RWL. The bank is configured so as to have the first and second word lines WL1 selected at one time on the basis of a row address XA. The defective word line address register 36stores defective word line information DWAthat identifies the first word line WL1, in association with one of the at least one redundant word line RWL. The array control circuit 37, in response to the supply of the row address XA, selects the redundant word line RWL associated with the defective word line information DWA, instead of the first word line WL1; and selects the second word line WL1. |
