| 摘要 |
<p>Provided is a force probe microscope with which high-resolution measurement is possible without lowering a Q value of a force probe even in a liquid. A height distribution of a surface of a sample (1) is measured using a force probe microscope in which a probe (12) is disposed upon a leading end of an oscillator (9), wherein the length of the probe is longer than the thickness of means (5, 6) which retain a liquid upon a sample platform (2).</p> |
