发明名称 |
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD |
摘要 |
A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34. |
申请公布号 |
US2014008541(A1) |
申请公布日期 |
2014.01.09 |
申请号 |
US201214005863 |
申请日期 |
2012.02.28 |
申请人 |
AKIYAMA KOUICHIRO;KAWADA YOICHI;YASUDA TAKASHI;NAKANISHI ATSUSHI;TAKAHASHI HIRONORI;HAMAMATSU PHOTONICS K.K. |
发明人 |
AKIYAMA KOUICHIRO;KAWADA YOICHI;YASUDA TAKASHI;NAKANISHI ATSUSHI;TAKAHASHI HIRONORI |
分类号 |
G01J3/42 |
主分类号 |
G01J3/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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