| 摘要 |
PROBLEM TO BE SOLVED: To provide a sealed symbol inspection device, method or the like for an electronic apparatus capable of determining the quality of a sealed symbol at high speed and with high accuracy regardless of fluctuation of the sealed symbol.SOLUTION: A sealed symbol inspection device 100 comprises: a sealed symbol identification section 200 for identifying a sealed symbol through a first neural network executing separation arithmetic on the basis of image data corresponding to an image obtained by imaging an area including a sealed symbol of an electronic component as an electronic apparatus; and a quality determination section 300 having a plurality of second neural networks executing separation arithmetic on the basis of image data and determining the quality of a sealed symbol through a second neural network, among the plurality of second neural networks, provided correspondingly for the sealed symbol identified by the sealed symbol identification section 200. |
