发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device and a method for manufacturing the same, capable of coming into ohmic contact with an n-type impurity region and achieving low-contact resistance for a p-type impurity region.SOLUTION: A silicon carbide semiconductor device 1 comprises a silicon carbide substrate 10 and a contact electrode 16. The silicon carbide substrate 10 includes an n-type region 14 and a p-type region 18 in contact with the n-type region 14. The contact electrode 16 is in contact with the n-type region 14 and the p-type region 18. The contact electrode 16 also includes an Ni atom and an Si atom. The number of Ni atoms is not less than 87% and not more than 92% of the total number of Ni atoms and Si atoms. |
申请公布号 |
JP2014003252(A) |
申请公布日期 |
2014.01.09 |
申请号 |
JP20120139385 |
申请日期 |
2012.06.21 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
YAMADA SHUNSUKE;TAMASO HIDETO |
分类号 |
H01L21/28;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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