发明名称 Flash memory with nanocrystalline silicon film floating gate
摘要 A memory is described which has memory cells that store data using hot electron injection. The data is erased through electron tunneling. The memory cells are described as floating gate transistors wherein the floating gate is fabricated using a conductive layer of nanocrystalline silicon particles. Each nanocrystalline silicon particle has a diameter of about 10 ANGSTROM to 100 ANGSTROM . The nanocrystalline silicon particles are in contact such that a charge stored on the floating gate is shared between the particles. The floating gate has a reduced electron affinity to allow for data erase operations using lower voltages.
申请公布号 US5852306(A) 申请公布日期 1998.12.22
申请号 US19970790500 申请日期 1997.01.29
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES, LEONARD
分类号 H01L29/423;H01L29/788;(IPC1-7):H01L29/788 主分类号 H01L29/423
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