发明名称 Non-volatile memory devices including capping layer contact holes
摘要 A non-volatile memory device includes a substrate having memory cell and peripheral circuit regions thereof. A non-volatile memory cell gate on a memory cell region of the substrate includes a floating gate on the substrate, a first insulating gate on the floating gate opposite the substrate, and a control gate on the first insulating layer opposite the floating gate. A resistor layer is provided on a peripheral circuit region of the substrate, and the second insulating layer is provided on the resistor layer opposite the substrate. In addition, a capping layer is provided on the second insulating layer opposite the resistor layer wherein a contact hole is defined by the second insulating layer and the capping layer thereby exposing a portion of the resistor layer. Related methods are also discussed.
申请公布号 US5852311(A) 申请公布日期 1998.12.22
申请号 US19970869703 申请日期 1997.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, KI-HO;JANG, DONG-SOO
分类号 H01L21/8247;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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