发明名称 TOUCH PANEL INSPECTION DEVICE OF DUAL TOUCH TYPE
摘要 <p>Disclosed is a touch panel inspection device of dual touch type which can detect a fault of a touch panel by measuring a resistance according to touch like an indium tin oxide (ITO) formed on the rear of a glass substrate constituting a liquid crystal panel. The touch panel inspection device of dual touch type by one embodiment of the present invention comprises: a frame having a base installed horizontally between an upper part and a lower part; a main body which moves along the left and right direction along a first guide of an X-axis direction installed in the base, and moves along the front and back direction along a second guide of an X-axis direction installed in the base, and moves along in an up and down direction along a third guide of a Z-axis direction installed on the base; a rotation member installed to be able to rotate up and down on the body by a first driving motor; a rotation member unit which is combined to the rotation as being able to move forward and backward, and has a rotation member installed to be able to rotate by a third driving motor and arranged in a bilateral symmetry; a touch unit comprising at least one touch member which is installed in each rotation member and touches an inspection area of a touch panel surface by touching the touch panel placed on a tray; and a control part which moves the touch member by making the touch member touch the surface of the touch panel along the inspection area of the touch panel, and judges fault of the touch panel by comparing a pre-established pattern signal with an input signal generated in the touch panel according to the movement of the touch member.</p>
申请公布号 KR101348278(B1) 申请公布日期 2014.01.08
申请号 KR20120079385 申请日期 2012.07.20
申请人 CHOI, JAE WON 发明人 CHOI, JAE WON
分类号 G01R31/02;G01R27/26;G06F3/041 主分类号 G01R31/02
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