| 摘要 |
PROBLEM TO BE SOLVED: To resolve the problems such as that it is difficult to detect a minute difference as a fault even if a minute difference occurs by the breaking of the wiring for grounding in ground potential between the circuits constituting the device, and that it is unable to extract a semiconductor integrated circuit device whose operation has become unstable by the minute difference of this ground potential, in the inspection process at mass production. SOLUTION: This semiconductor integrated circuit device is equipped with a plurality of terminals for grounding which are supplied with ground potential from the supply source of outside ground potential, a plurality of wirings for grounding which are electrically connected to each of the plurality terminals for grounding and supply an internal circuit with ground potential, a resistor which is provided between the adjacent wirings for grounding, a terminal for inspection which does not have electric connection with the supply source of earth potential, and a switching means which switches the connection destinations of the wiring for grounding and the terminal for grounding so that the terminal for grounding and the terminal for inspection may be connected with each other through a resistor, when inspecting the connection state of the wiring for grounding.
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